Rochford K B, Rose A H, Williams P A, Wang C M, Clarke I G, Hale P D, Day G W
Appl Opt. 1997 Sep 1;36(25):6458-65. doi: 10.1364/ao.36.006458.
The National Institute of Standards and Technology (NIST) has developed a nominally quarter-wave linear retarder for wavelengths near 1.3 mum that is stable within +/-0.1 degrees retardance over a range of wavelength, input angle, temperature, and environmental variations. The device consists of two concatenated Fresnel rhombs made from a low stress-optic-coefficient glass that minimizes the residual birefringence from machining and packaging. Device machining, assembly, and antireflection coating tolerances are discussed, and the theoretical performance is compared with measurements. Humidity can modify retardance of the total-internal-reflection surfaces; we discuss packaging that mitigates this effect and provides an estimated 10-year lifetime for the device. Several measurement methods were intercompared to ensure that the device retardance can be measured with an uncertainty less than 0.1 degrees . Similar retarders will be certified by NIST and made available as Standard Reference Materials.
美国国家标准与技术研究院（NIST）已开发出一种标称四分之一波长的线性延迟器，用于波长接近1.3微米的情况，在波长、入射角、温度和环境变化范围内，其延迟稳定在±0.1度以内。该装置由两块由低应力光学系数玻璃制成的级联菲涅耳菱体组成，可将加工和封装产生的残余双折射降至最低。讨论了器件的加工、组装和抗反射涂层公差，并将理论性能与测量结果进行了比较。湿度会改变全内反射表面的延迟；我们讨论了减轻这种影响并为该装置提供约10年使用寿命的封装方式。对几种测量方法进行了相互比较，以确保能够以小于0.1度的不确定度测量器件延迟。类似的延迟器将由NIST认证，并作为标准参考材料提供。
