Lim Leonard T W, Wee Andrew T S, O'Shea Sean J
Department of Physics, National University of Singapore, Lower Kent Ridge Road, Singapore 119620.
Langmuir. 2008 Mar 18;24(6):2271-3. doi: 10.1021/la703231h. Epub 2008 Feb 12.
An atomic force microscope (AFM) has been used to study solvation forces at the solid-liquid interface between highly oriented pyrolytic graphite (HOPG) and the liquids octamethylcyclotetrasiloxane (OMCTS), n-hexadecane (n-C16H34), and n-dodecanol (n-C11H23CH2OH). Oscillatory solvation forces (F) are observed for various measured tip radii (Rtip=15-100 nm). It is found that the normalized force data, F/Rtip, differ between AFM tips with a clear trend of decreasing F/Rtip with increasing Rtip.
原子力显微镜（AFM）已被用于研究高度取向热解石墨（HOPG）与八甲基环四硅氧烷（OMCTS）、正十六烷（n-C16H34）和正十二醇（n-C11H23CH2OH）等液体之间固液界面的溶剂化力。对于各种测量的针尖半径（Rtip = 15 - 100 nm），均观察到振荡溶剂化力（F）。研究发现，归一化力数据F/Rtip在不同的AFM针尖之间存在差异，并且随着Rtip的增加，F/Rtip呈现出明显的下降趋势。
