Haner D A, McGuckin B T, Menzies R T, Bruegge C J, Duval V
Appl Opt. 1998 Jun 20;37(18):3996-9. doi: 10.1364/ao.37.003996.
The directional-hemispherical reflectance is obtained for Spectralon, the material chosen for onboard radiometric calibration of the multiangle imaging spectroradiometer, at laser wavelengths of 442, 632.8, and 859.9 nm. With p- and s-polarized incident light and for an angle of incidence of 45 degrees , the bidirectional reflectance distribution function was measured over a polar angle range of 1-85 degrees and a range of azimuthal angles of 0-180 degrees in 10 degrees increments. The resultant directional-hemispherical reflectance is found by integration to be 1.00 ? 0.01 at 442 nm, 0.953 ? 0.01 at 632.8 nm, and 0.956 ? 0.01 at 859.9 nm. The experimental methodology and the data analysis are presented together with a full discussion of the primary experimental errors.
在442、632.8和859.9纳米的激光波长下，获取了用于多角度成像光谱辐射计机载辐射定标的材料Spectralon的方向-半球反射率。对于p偏振和s偏振入射光，以及45度的入射角，在1至85度的极角范围内和0至180度的方位角范围内，以10度增量测量双向反射分布函数。通过积分得出，在442纳米处的方向-半球反射率为1.00±0.01，在632.8纳米处为0.953±0.01，在859.9纳米处为0.956±0.01。文中介绍了实验方法和数据分析，并对主要实验误差进行了全面讨论。
