Aglitskiy Y, Lehecka T, Obenschain S, Bodner S, Pawley C, Gerber K, Sethian J, Brown C M, Seely J, Feldman U, Holland G
Appl Opt. 1998 Aug 1;37(22):5253-61. doi: 10.1364/ao.37.005253.
We have developed an improved x-ray imaging system based on spherically curved crystals. It is designed and used for diagnostics of targets ablatively accelerated by the Nike KrF laser. A spherically curved quartz crystal (d = .?, R = mm) has been used to produce monochromatic backlit images with the He-like Si resonance line (1865 eV) as the source of radiation. The spatial resolution of the x-ray optical system is 1.7 mum in selected places and 2-3 mum over a larger area. Time-resolved backlit monochromatic images of polystyrene planar targets driven by the Nike facility have been obtained with a spatial resolution of 2.5 mum in selected places and 5 mum over the focal spot of the Nike laser.
我们已经开发出一种基于球形弯曲晶体的改进型X射线成像系统。它被设计用于诊断由耐克KrF激光烧蚀加速的靶材。一块球形弯曲的石英晶体（d =.?，R = 毫米）被用来以类氦硅共振线（1865电子伏特）作为辐射源来产生单色背光图像。X射线光学系统在选定位置的空间分辨率为1.7微米，在更大区域内为2 - 3微米。利用耐克装置驱动聚苯乙烯平面靶材获得了时间分辨的背光单色图像，在选定位置的空间分辨率为2.5微米，在耐克激光焦斑上为5微米。
