Wiesemann Klaus
Ruhr-Universität Bochum, AEPT Geb IC 1-155, Bochum, Germany.
Rev Sci Instrum. 2008 Feb;79(2 Pt 2):02B506. doi: 10.1063/1.2805659.
We consider plasma properties in the most advanced type of plasma ion sources, electron cyclotron resonance ion sources for highly charged ions. Depending on the operation conditions the plasma in these sources may be highly ionized, which completely changes its transport properties. The most striking difference to weakly ionized plasma is that diffusion will become intrinsically ambipolar. We further discuss means of plasma diagnostics. As noninvasive diagnostic methods we will discuss analysis of the ion beam, optical spectroscopy, and measurement of the x-ray bremsstrahlung continuum. From beam analysis and optical spectroscopy one may deduce ion densities, and electron densities and distribution functions as a mean over the line of sight along the axis (optical spectroscopy) or at the plasma edge (ion beam). From x-ray spectra one obtains information about the population of highly energetic electrons and the energy transfer from the driving electromagnetic waves to the plasma -- basic data for plasma modeling.
我们考虑最先进类型的等离子体离子源——用于高电荷离子的电子回旋共振离子源中的等离子体特性。根据运行条件，这些源中的等离子体可能高度电离，这会完全改变其输运特性。与弱电离等离子体最显著的区别在于扩散将本质上变为双极扩散。我们进一步讨论等离子体诊断方法。作为非侵入性诊断方法，我们将讨论离子束分析、光谱学以及X射线轫致辐射连续谱的测量。通过束流分析和光谱学，可以沿轴（光谱学）或在等离子体边缘（离子束）在视线方向上平均推导出离子密度、电子密度和分布函数。从X射线光谱中，可以获得有关高能电子数量以及从驱动电磁波到等离子体的能量转移的信息——这些是等离子体建模的基础数据。
