Kavner A, Nugent C
Earth and Space Science Department and Institute for Geophysics and Planetary Physics, University of California, Los Angeles, Los Angeles, California 90095, USA.
Rev Sci Instrum. 2008 Feb;79(2 Pt 1):024902. doi: 10.1063/1.2841173.
A new spectroradiometry system specialized for measuring two-dimensional temperature gradients for samples at high pressure in the laser heated diamond anvil cell has been designed and constructed at UCLA. Emitted light intensity from sample hotspots is imaged by a videocamera for real time monitoring, an imaging spectroradiometer for temperature measurement, and a high-dynamic-range camera that examines a magnified image of the two-dimensional intensity distribution of the heated spot, yielding precise measurements of temperature gradients. With this new system, most systematic errors in temperature measurement due to chromatic aberration are bypassed. We use this system to compare several different geometries of temperature measurement found in the literature, including scanning a pinhole aperture, and narrow-slit and wide-slit entrance apertures placed before the imaging spectrometer. We find that the most accurate way of measuring a temperature is to use the spectrometer to measure an average hotspot temperature and to use information from the imaging charge coupled device to calculate the temperature distribution to the hotspot. We investigate the effects of possible wavelength- and temperature-dependent emissivity, and evaluate their errors. We apply this technique to measure the anisotropy in temperature distribution of highly oriented graphite at room temperature and also at high pressures. A comparison between model and experiment demonstrates that this system is capable of measuring thermal diffusivity in anisotropic single crystals and is also capable of measuring relative thermal diffusivity at high pressures and temperatures among different materials. This shows the possibility of using this system to provide information about thermal diffusivity of materials at high pressure and temperature.
加州大学洛杉矶分校设计并构建了一种新型光谱辐射测量系统,该系统专门用于测量激光加热金刚石对顶砧中高压样品的二维温度梯度。样品热点发出的光强由一台视频摄像机成像以进行实时监测,由一台成像光谱辐射计用于温度测量,还有一台高动态范围相机用于检查加热点二维强度分布的放大图像,从而实现对温度梯度的精确测量。借助这个新系统,因色差导致的温度测量中的大多数系统误差得以避免。我们使用该系统比较了文献中发现的几种不同的温度测量几何结构,包括扫描针孔孔径,以及在成像光谱仪之前放置的窄缝和宽缝入口孔径。我们发现测量温度最准确的方法是使用光谱仪测量热点的平均温度,并利用来自成像电荷耦合器件的信息来计算热点的温度分布。我们研究了可能的波长和温度相关发射率的影响,并评估了它们的误差。我们应用这项技术测量了室温及高压下高度取向石墨温度分布的各向异性。模型与实验的比较表明,该系统能够测量各向异性单晶中的热扩散率,也能够测量不同材料在高压和高温下的相对热扩散率。这表明使用该系统提供有关材料在高压和高温下热扩散率信息的可能性。