Gobin L, Blanchot L, Saint-Jalmes H
Laboratoire d'Etude et de Recherche en Instrumentation Signaux et Systèmes, Université Paris XII, Bâtiment P2, 61 avenue De Gaulle, 94010 Créteil Cedex, France.
Appl Opt. 1999 Jul 1;38(19):4217-27. doi: 10.1364/ao.38.004217.
Measurement of absorption and reduced-scattering optical coefficients microa and micros' is possible when a steady-state backscattered image is used on a sample surface. A new method for processing the backscattered image, acquired with a CCD, has been developed. The image is integrated to decrease sensitivity to noise. The resulting curve is defined as the integral reflectance. The curve is then fitted with a relaxation model to evaluate microa and micros'. We have validated the method with calibrated scattering and absorption phantoms. The integral reflectance method is then applied to measurements of the microa and micros' coefficients of human skin in vivo.
当在样品表面使用稳态背散射图像时，可以测量吸收光学系数μₐ和约化散射光学系数μₛ'。已经开发出一种用于处理用电荷耦合器件（CCD）获取的背散射图像的新方法。对图像进行积分以降低对噪声的敏感度。所得曲线定义为积分反射率。然后将该曲线与弛豫模型拟合以评估μₐ和μₛ'。我们已经用校准的散射和吸收体模验证了该方法。然后将积分反射率方法应用于体内人体皮肤的μₐ和μₛ'系数的测量。
