Ayräs P H, Friberg A T, Kaivola M A, Salomaa M M
Materials Physics Laboratory, Helsinki University of Technology, PO Box 2200 ~Technical Physics, FIN-02015 HUT Espoo, Finland.
Appl Opt. 1999 Sep 1;38(25):5399-407. doi: 10.1364/ao.38.005399.
Conoscopic interferometry is applied for determining the crystal orientation of lithium niobate and other commonly employed substrate wafers for integrated-optic and surface-acoustic-wave devices. The method is particularly applicable for detecting the orientation of the optic axes of the strongly birefringent niobate but is less sensitive for lithium tantalate or quartz. Conoscopic interference is a low-cost and easy-to-use method that is especially suitable for laboratory usage.
锥光干涉测量法用于确定铌酸锂以及集成光学和表面声波器件中其他常用衬底晶片的晶体取向。该方法特别适用于检测强双折射铌酸盐的光轴取向，但对钽酸锂或石英的敏感性较低。锥光干涉是一种低成本且易于使用的方法，特别适合实验室使用。
