Marschner S R, Westin S H, Lafortune E P, Torrance K E
Program of Computer Graphics, Cornell University, 580 Rhodes Hall, Ithaca, New York 14853-3801, USA.
Appl Opt. 2000 Jun 1;39(16):2592-600. doi: 10.1364/ao.39.002592.
We present a new image-based process for measuring a surface's bidirectional reflectance rapidly, completely, and accurately. Requiring only two cameras, a light source, and a test sample of known shape, our method generates densely spaced samples covering a large domain of illumination and reflection directions. We verified our measurements both by tests of internal consistency and by comparison against measurements made with a gonioreflectometer. The resulting data show accuracy rivaling that of custom-built dedicated instruments.
我们提出了一种基于图像的新方法，用于快速、全面且准确地测量表面的双向反射率。该方法仅需两个摄像头、一个光源和一个已知形状的测试样本，就能生成密集分布的样本，覆盖大范围的照明和反射方向。我们通过内部一致性测试以及与测角反射仪测量结果的对比，验证了我们的测量结果。所得数据显示出的精度可与定制的专用仪器相媲美。
