Kuo W K, Chen W H, Huang Y T, Huang S L
Appl Opt. 2000 Sep 20;39(27):4985-93. doi: 10.1364/ao.39.004985.
An electro-optic probe tip that is made from LiTaO crystal to make tangentially two-dimensional electric-field (E-field) vector measurements is presented. We combine a new electro-optic modulation technique and a conventional one to resolve the two E-field components. The new modulation effect on the optical probing beam is caused by rotation of the principal axis the electro-optic crystal, which is proportional to the E-field. Inasmuch as there is no free charge involved in the axis rotation, rotation modulation of the axis can be as fast as conventional modulation. The principles are carefully derived, and an experimental system constructed, to measure two-dimensional E-field vectors on a test pattern. The results are in good agreement with those obtained with commercial software for electromagnetic simulation. The sensitivities of two tangential E-field components are 76 (mV/cm)/ radicalHz and 0.8 (V/cm)/ radicalHz, respectively. The root-mean-square error of an E-field directional measurement is 1.5 degrees .
本文介绍了一种由钽酸锂（LiTaO）晶体制成的电光探头尖端，用于进行二维切向电场（E场）矢量测量。我们将一种新的电光调制技术与传统技术相结合，以解析两个E场分量。对光学探测光束的新调制效应是由电光晶体主轴的旋转引起的，该旋转与E场成正比。由于轴旋转过程中不涉及自由电荷，因此轴的旋转调制可以与传统调制一样快。我们仔细推导了原理，并构建了一个实验系统，用于测量测试图案上的二维E场矢量。结果与商业电磁模拟软件获得的结果吻合良好。两个切向E场分量的灵敏度分别为76（mV/cm）/√Hz和0.8（V/cm）/√Hz。E场方向测量的均方根误差为1.5度。
