光折变SBN:60的连续波Z扫描测量

Continuous-wave Z-scan measurement of photorefractive SBN:60.

作者信息

Siahmakoun A, Breitling D, Najaf-Zadeh R A

机构信息

Department of Physics and Applied Optics, Rose-Hulman Institute of Technology, Terre Haute, Indiana 47803, USA.

出版信息

Appl Opt. 2000 Oct 10;39(29):5360-6. doi: 10.1364/ao.39.005360.

DOI:10.1364/ao.39.005360

PMID:18354533

Abstract

A cw-probe Z-scan technique was employed to measure the photoinduced index change in a photorefractive SBN:60 crystal. For this experiment a three-detector data-acquisition system was used to account for temporal changes in the laser. The effects of various beam parameters such as intensity, polarization, and wavelength were studied. A theoretical simulation of the Z scan based on a band-transport model of photorefractive-index variation was also developed. This model provides reasonable agreement with the experimental results.

摘要

采用连续波探针Z扫描技术测量光折变SBN:60晶体中的光致折射率变化。对于该实验，使用了三探测器数据采集系统来考虑激光的时间变化。研究了各种光束参数（如强度、偏振和波长）的影响。还基于光折变折射率变化的带输运模型开发了Z扫描的理论模拟。该模型与实验结果具有合理的一致性。