使用镊子型探针通过原子力显微镜拾取操作中期染色体片段。

AFM picking-up manipulation of the metaphase chromosome fragment by using the tweezers-type probe.

作者信息

Yamanaka Keiichiro, Saito Masato, Shichiri Motoharu, Sugiyama Sigeru, Takamura Yuzuru, Hashiguchi Gen, Tamiya Eiichi

机构信息

Department of Biological Science and Biotechnology, School of Materials Science, Japan Advanced Institute of Science and Technology, 1-1 Asahidai, Nomi, Ishikawa 923-1292, Japan.

出版信息

Ultramicroscopy. 2008 Aug;108(9):847-54. doi: 10.1016/j.ultramic.2008.02.004. Epub 2008 Feb 29.

DOI:10.1016/j.ultramic.2008.02.004

PMID:18396375

Abstract

We have studied the development of a new procedure based on atomic force microscopy (AFM) for the analysis of metaphase chromosome. The aim of this study was to obtain detailed information about the specific locations of genes on the metaphase chromosome. In this research, we performed the manipulation of the metaphase chromosome by using novel AFM probes to obtain chromosome fragments of a smaller size than the ones obtained using the conventional methods, such as glass microneedles. We could pick up the fragment of the metaphase chromosome dissected by the knife-edged probe by using our tweezers-type probe.

摘要

我们研究了一种基于原子力显微镜（AFM）分析中期染色体的新方法的开发。本研究的目的是获取有关中期染色体上基因特定位置的详细信息。在这项研究中，我们通过使用新型AFM探针来操作中期染色体，以获得比使用传统方法（如玻璃微针）获得的染色体片段更小的染色体片段。我们可以用镊子型探针拾取由刀刃状探针切割的中期染色体片段。