Schwefel H G L, Köhler W, Lu Z H, Fan J, Wang L J
Max-Planck Research Group, Institute of Optics, Information and Photonics, University of Erlangen-Nuremberg, Günther-Scharowsky-Strasse 1, Bau 24, 91058 Erlangen, Germany.
Opt Lett. 2008 Apr 15;33(8):794-6. doi: 10.1364/ol.33.000794.
We report a precise direct measurement of the Goos-Hänchen shift after one reflection off a dielectric interface coated with periodic metal stripes. The spatial displacement of the shift is determined by image analysis. A maximal absolute shift of 5.18 and 23.39 mum for TE and TM polarized light, respectively, is determined. This technique is simple to implement and can be used for a large range of incident angles.
我们报告了在涂有周期性金属条纹的电介质界面单次反射后古斯-汉欣位移的精确直接测量。该位移的空间偏移通过图像分析确定。对于TE和TM偏振光，分别确定了最大绝对位移为5.18微米和23.39微米。该技术易于实施，可用于大范围的入射角。
