Mastronarde D N
Boulder Laboratory for Three-dimensional Electron Microscopy of Cells, Department of Molecular, Cellular, and Developmental Biology, University of Colorado, Boulder, CO 80309, USA.
J Microsc. 2008 May;230(Pt 2):212-7. doi: 10.1111/j.1365-2818.2008.01977.x.
A correction for non-perpendicularity between the beam axis and the tilt axis in electron tomographic tilt series has been implemented in the IMOD software package and its value and limitations have been explored. Correction for this effect can provide a significant improvement in the alignment error and the reconstruction quality in some cases. However, when the projection model being fit includes an anisotropic shrinkage (i.e. stretch) in the plane of the specimen, adding a variable for the beam tilt does not produce a lower alignment error; it is thus not possible to distinguish between the effects of stretch and beam tilt. Test reconstructions indicate that an alignment solution that includes stretch will adequately correct for the effects of a beam tilt. For specimens subject to deformation under the beam, an alignment solution that accounts for stretch is preferable to one that accounts for beam tilt instead, provided that the markers used for alignment are sufficiently well distributed. Otherwise, a correction for beam tilt should be used.
IMOD软件包中已实现对电子断层扫描倾斜序列中光束轴与倾斜轴之间非垂直性的校正,并对其值和局限性进行了探索。在某些情况下,对此效应进行校正可显著改善对准误差和重建质量。然而,当拟合的投影模型在样品平面内包括各向异性收缩(即拉伸)时,添加光束倾斜变量并不会产生更低的对准误差;因此,无法区分拉伸和光束倾斜的影响。测试重建表明,包含拉伸的对准解决方案将充分校正光束倾斜的影响。对于在光束下会发生变形的样品,只要用于对准的标记分布足够均匀,考虑拉伸的对准解决方案比考虑光束倾斜的解决方案更可取。否则,应使用光束倾斜校正。