Rochau G A, Bailey J E, Maron Y, Chandler G A, Dunham G S, Fisher D V, Fisher V I, Lemke R W, Macfarlane J J, Peterson K J, Schroen D G, Slutz S A, Stambulchik E
Sandia National Laboratories, Albuquerque, New Mexico 87185, USA.
Phys Rev Lett. 2008 Mar 28;100(12):125004. doi: 10.1103/PhysRevLett.100.125004.
The Z-pinch dynamic hohlraum is an x-ray source for high energy-density physics studies that is heated by a radiating shock to radiation temperatures >200 eV. The time-dependent 300-400 eV electron temperature and 15-35 mg/cc density of this shock have been measured for the first time using space-resolved Si tracer spectroscopy. The shock x-ray emission is inferred from these measurements to exceed 50 TW, delivering >180 kJ to the hohlraum.
Z箍缩动态黑腔是一种用于高能量密度物理研究的X射线源，它由辐射激波加热至辐射温度大于200电子伏特。首次利用空间分辨硅示踪光谱法测量了该激波随时间变化的300 - 400电子伏特电子温度和15 - 35毫克/立方厘米的密度。根据这些测量结果推断，激波的X射线发射超过50太瓦，向黑腔输送的能量大于180千焦。
