Kobyakov Andrey, Zakharian Aramais R, Mafi Arash, Darmanyan Sergey A
Corning Incorporated, Science and Technology Division, One Science Center Drive, SP-TD-01-1, Corning, NY 14831, USA.
Opt Express. 2008 Jun 9;16(12):8938-57. doi: 10.1364/oe.16.008938.
We present a detailed description of a computationally efficient, semi-analytical method (SAM) to calculate the electomagnetic field distribution in a 1D-periodic, subwavelength-structured metal film placed between dielectric substrates. The method is roughly three orders of magnitude faster than the finite-element method (FEM). SAM is used to study the resonant transmission of light through nanoplasmonic structures, and to analyze the role of fundamental and higher-order Bloch surface plasmons in transmission enhancement. The method is also suitable for solving the eigenvalue problem and finding modes of the structure. Results obtained with SAM, FEM, and the finite-difference time-domain method show very good agreement for various parameters of the structure.
我们详细描述了一种计算效率高的半解析方法(SAM),用于计算置于介电基片之间的一维周期性亚波长结构金属膜中的电磁场分布。该方法比有限元方法(FEM)快约三个数量级。SAM用于研究光通过纳米等离子体结构的共振传输,并分析基模和高阶布洛赫表面等离子体在传输增强中的作用。该方法也适用于求解本征值问题并找到结构的模式。用SAM、FEM和时域有限差分法得到的结果对于结构的各种参数显示出非常好的一致性。