Ditlbacher H, Galler N, Koller D M, Hohenau A, Leitner A, Aussenegg F R, Krenn J R
Karl-Franzens University and Erwin Schrödinger Institute for Nanoscale Research, Graz, Austria.
Opt Express. 2008 Jul 7;16(14):10455-64. doi: 10.1364/oe.16.010455.
We study dielectric/metal thin film multilayers designed for the coupling of dielectric waveguide modes and surface plasmons. The coupling as identified in calculated dispersion relations for extended multilayers is confirmed by measured angle-resolved reflectance data. By lateral structuring of the multilayers the mutual coupling of dielectric and plasmonic modes is directly observed by fluorescence based microscopy. For a light wavelength of 514nm we find a coupling length of 15microm. Our results highlight the potential of hybrid dielectric/metal waveguides for integrating surface plasmon based photonic circuitry or sensing elements into conventional optical devices.
我们研究了用于介电波导模式与表面等离子体激元耦合的介电/金属薄膜多层结构。通过测量角度分辨反射率数据，证实了在扩展多层结构的计算色散关系中所确定的耦合。通过对多层结构进行横向结构化，利用基于荧光的显微镜直接观察到了介电模式与等离子体激元模式的相互耦合。对于514nm的光波长，我们发现耦合长度为15微米。我们的结果突出了混合介电/金属波导在将基于表面等离子体激元的光子电路或传感元件集成到传统光学器件中的潜力。
