Barman Sudip, Deng Fengjun, McCreery Richard L
National Institute for Nanotechnology, Department of Chemistry, University of Alberta, Edmonton, Alberta, Canada T6G 2M9.
J Am Chem Soc. 2008 Aug 20;130(33):11073-81. doi: 10.1021/ja802673w. Epub 2008 Jul 23.
Molecular electronic junctions consisting of a 20 nm thick layer of polypyrrole (PPy) and 10 nm of TiO2 between conducting layers of carbon and gold were investigated as potential nonvolatile memory devices. By making the polymer layer much thinner than conventional polymer electronic devices, it is possible to dynamically oxidize and reduce the polypyrrole layer by an applied bias. When the electrode in contact with the PPy is biased positive, oxidation of the PPy occurs to yield a conducting polaron state. The junctions exhibit a large increase in conductance in response to the positive bias, which is reversed by a subsequent negatively biased pulse. Switching between the conducting and nonconducting state can occur for pulses at least as short as 10 micros, and the conducting state persists after a positive bias pulse for at least 1 week. The read/write/read/erase cycle may be repeated for at least 1700 cycles, although with an error rate of approximately 3% due mainly to an incomplete "erase" step. The speed and retention of the PPy/TiO2 junctions are far superior to those of the analogous fluorene/TiO2 devices lacking the polymer, and the conductance changes are absent if SiO2 is substituted for TiO2. The observations are consistent with "dynamic doping" of the solid-state polymer layer, with the possible involvement of adventitious mobile ions. Although the speed of the current polymer/TiO2 junctions is slower than commercial dynamic random access memory, their retention is approximately 5 orders of magnitude longer.
研究了由20纳米厚的聚吡咯(PPy)层和夹在碳与金导电层之间的10纳米二氧化钛组成的分子电子结作为潜在的非易失性存储器件。通过使聚合物层比传统聚合物电子器件薄得多,可以通过施加偏压动态氧化和还原聚吡咯层。当与PPy接触的电极偏置为正时,PPy发生氧化,产生导电极化子状态。这些结在正偏压下电导率大幅增加,随后的负偏压脉冲可使其反转。对于至少短至10微秒的脉冲,导电态和非导电态之间可以发生切换,并且在正偏压脉冲后导电态至少持续1周。读/写/读/擦除循环可以重复至少1700次,不过由于主要是“擦除”步骤不完全,错误率约为3%。PPy/TiO₂结的速度和保持能力远优于缺乏聚合物的类似芴/TiO₂器件,如果用SiO₂替代TiO₂则不存在电导率变化。这些观察结果与固态聚合物层的“动态掺杂”一致,可能涉及外来移动离子。尽管当前聚合物/TiO₂结的速度比商业动态随机存取存储器慢,但其保持时间大约长5个数量级。