亚纳秒塑料闪烁体特性的条纹相机测量

Streak camera measurement of subnanosecond plastic scintillator properties.

作者信息

Cheng J C, Tirsell K G, Tripp G R, Lent E M, Lerche R A

机构信息

Lawrence Livermore Laboratory, University of California, Livermore, CA 94550, USA.

出版信息

Rev Sci Instrum. 1978 May;49(5):650. doi: 10.1063/1.1135476.

DOI:10.1063/1.1135476

PMID:18699166

Abstract

A streak camera technique with temporal resolution of 20 ps has been used to measure the fluorescence properties of several subnanosecond plastic scintillators. The method employs a vacuum light pipe coupled to an optical streak camera. The scintillators are excited by a 200-ps x-ray pulse generated by a 1.06-microm Nd:YAG laser focused onto an iron target. The time history of the low-energy x-ray pulse is measured with an x-ray streak camera. Results are given for NElll plastic scintillators doped with benzophenone or acetophenone, for PVT doped with butyl-PBD, and for a ZnO phosphor doped with Ga.

摘要

一种时间分辨率为20皮秒的条纹相机技术已被用于测量几种亚纳秒塑料闪烁体的荧光特性。该方法采用与光学条纹相机耦合的真空光管。闪烁体由聚焦在铁靶上的1.06微米钕钇铝石榴石激光器产生的200皮秒X射线脉冲激发。用X射线条纹相机测量低能X射线脉冲的时间历程。给出了掺杂二苯甲酮或苯乙酮的NElll塑料闪烁体、掺杂丁基-PBD的PVT以及掺杂镓的氧化锌磷光体的测量结果。