Sato Yuta, Yanagi Kazuhiro, Miyata Yasumitsu, Suenaga Kazu, Kataura Hiromichi, Iijima Sumio
Nanotube Research Center, National Institute of Advanced Industrial Science and Technology, and JST-CREST, Tsukuba 305-8565, Japan.
Nano Lett. 2008 Oct;8(10):3151-4. doi: 10.1021/nl801364g. Epub 2008 Aug 26.
Chiral indices (n, m) of metallic and semiconducting single-walled carbon nanotubes (SWNTs) selectively separated via the density-gradient ultracentrifugation process were individually assigned by using an aberration-corrected transmission electron microscope (TEM) operated at 80 kV. Our statistical analysis revealed that armchair (n, n) and chiral (n, n-3) SWNTs with large chiral angles (>20 degrees) are dominant metallic nanotubes in the separated samples, whereas such a noticeable preference of particular indices was not observed for semiconducting nanotubes. Some significant discrepancies were found between the TEM and spectroscopic results on the major chiral indices and the metal/semiconductor ratios in these SWNTs.
通过密度梯度超速离心法选择性分离的金属和半导体单壁碳纳米管(SWNTs)的手性指数(n,m),使用在80 kV下运行的像差校正透射电子显微镜(TEM)分别进行了测定。我们的统计分析表明,扶手椅型(n,n)和手性角较大(>20度)的手性(n,n-3)单壁碳纳米管是分离样品中的主要金属纳米管,而对于半导体纳米管未观察到特定指数的这种明显偏好。在这些单壁碳纳米管的主要手性指数以及金属/半导体比率方面,透射电子显微镜和光谱结果之间发现了一些显著差异。