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通过软X射线激发光致发光和X射线吸收光谱研究镁酞菁(MgPc)固体薄膜的电子和光学性质。

Electronic and optical properties of magnesium phthalocyanine (MgPc) solid films studied by soft X-ray excited optical luminescence and X-ray absorption spectroscopies.

作者信息

Peltekis N, Holland B N, Krishnamurthy S, McGovern I T, Poolton N R J, Patel S, McGuinness C

机构信息

School of Physics, Trinity College Dublin, College Green, Dublin 2, Republic of Ireland.

出版信息

J Am Chem Soc. 2008 Oct 1;130(39):13008-12. doi: 10.1021/ja803063b. Epub 2008 Sep 3.

Abstract

In a study to link the optical and structural properties of solid films of magnesium Phthalocyanine (MgPc), a range of synchrotron based spectroscopic methods have been used. These include X-ray excited optical luminescence (XEOL) together with X-ray absorption spectroscopy (XAS) measured both by total electron yield methods (TEY) and by using the optically detected photoluminescence yield method (PLY). XEOL spectra below K shell threshold show a broad emission peak at approximately 860 nm which can be attributed to the optical Q-band of these organic systems, which is then suppressed above the threshold. The shift to higher wavelength compared to optical emission spectra from MgPc in solution is consistent with intermolecular coupling of the excited states in the loosely intermolecular bonded phthalocyanine crystal structure. Zero order total PLY spectra at both C and N K edges are compared to TEY spectra where at the C K edge an inversion of intensity ratios between features is observed. Wavelength-specific PLY absorption spectra taken at 860 nm at the N K edge show a role for sigma* states participating in the luminescence process possibly through the sigma-like lone pair of bridging nitrogen atom, denoted the n --> pi* transition.

摘要

在一项旨在关联镁酞菁(MgPc)固体薄膜的光学和结构特性的研究中,使用了一系列基于同步加速器的光谱方法。这些方法包括X射线激发光学发光(XEOL)以及通过全电子产额法(TEY)和光学检测光致发光产额法(PLY)测量的X射线吸收光谱(XAS)。低于K壳层阈值的XEOL光谱在约860nm处显示出一个宽发射峰,这可归因于这些有机体系的光学Q带,该峰在阈值以上被抑制。与溶液中MgPc的光发射光谱相比,向更高波长的移动与松散分子间键合的酞菁晶体结构中激发态的分子间耦合一致。将C和N K边缘处的零阶全PLY光谱与TEY光谱进行比较,在C K边缘观察到特征之间强度比的反转。在N K边缘860nm处获取的波长特定PLY吸收光谱显示,σ态可能通过桥连氮原子类似σ的孤对电子参与发光过程,这被称为n→π跃迁。

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