Iuchi Satoru, Chen Hanning, Paesani Francesco, Voth Gregory A
Department of Chemistry and Center for Biophysical Modeling and Simulation, University of Utah, Salt Lake City, 84112-0850, USA.
J Phys Chem B. 2009 Apr 2;113(13):4017-30. doi: 10.1021/jp805304j.
The behavior of the hydrated excess proton is investigated at the water-vapor, water-hydrophobic wall, and water-carbon tetrachloride interfaces through molecular dynamics simulations using the third-generation multistate empirical valence bond model (MS-EVB3). The MS-EVB3 simulations show a surface preference of the excess proton at the water-vapor interface, consistent with the discovery of this effect using an earlier version of the MS-EVB model (Petersen et al. J. Phys. Chem. B 2004, 108, 14804) and with the experimental results. The preference of the hydrated excess proton for other water-hydrophobic interfaces is also analyzed for the first time. The hydrated proton structures and charge defect delocalization effects at these interfaces are discussed in detail. By decomposing the free energy profiles into the internal energy and entropic contributions, the thermodynamic (free energy) driving forces for the surface preference of the excess proton are also elaborated. These results indicate that the "rigid" hydrated proton structures at all the interfaces are energetically (as opposed to entropically) stabilized due to the "amphiphilic" nature of the hydrated excess proton, resulting in its overall interfacial concentration enhancement. The effects of acid concentration and nuclear quantization are also explored.
使用第三代多态经验价键模型(MS-EVB3)通过分子动力学模拟研究了水合过量质子在水蒸气、水-疏水壁和水-四氯化碳界面的行为。MS-EVB3模拟显示过量质子在水蒸气界面存在表面偏好,这与使用早期版本的MS-EVB模型(彼得森等人,《物理化学杂志B》,2004年,108卷,14804页)发现的这种效应以及实验结果一致。首次还分析了水合过量质子对其他水-疏水界面的偏好。详细讨论了这些界面处的水合质子结构和电荷缺陷离域效应。通过将自由能分布分解为内能和熵贡献,还阐述了过量质子表面偏好的热力学(自由能)驱动力。这些结果表明,由于水合过量质子的“两亲”性质,所有界面处的“刚性”水合质子结构在能量上(而非熵上)得到稳定,导致其整体界面浓度增加。还探讨了酸浓度和核量子化的影响。