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通过光子统计光谱法表征半导体量子点微腔中的强光-物质耦合

Characterization of strong light-matter coupling in semiconductor quantum-dot microcavities via photon-statistics spectroscopy.

作者信息

Schneebeli L, Kira M, Koch S W

机构信息

Department of Physics and Material Sciences Center, Philipps-University, 35032 Marburg, Germany.

出版信息

Phys Rev Lett. 2008 Aug 29;101(9):097401. doi: 10.1103/PhysRevLett.101.097401. Epub 2008 Aug 28.

Abstract

It is shown that spectrally resolved photon-statistics measurements of the resonance fluorescence from realistic semiconductor quantum-dot systems allow for high contrast identification of the two-photon strong-coupling states. Using a microscopic theory, the second-rung resonance of Jaynes-Cummings ladder is analyzed and optimum excitation conditions are determined. The computed photon-statistics spectrum displays gigantic, experimentally robust resonances at the energetic positions of the second-rung emission.

摘要

结果表明,对实际半导体量子点系统的共振荧光进行光谱分辨光子统计测量,能够实现对双光子强耦合态的高对比度识别。利用微观理论,对Jaynes-Cummings ladder的第二级共振进行了分析,并确定了最佳激发条件。计算得到的光子统计谱在第二级发射的能量位置处显示出巨大的、实验上稳健的共振。

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