Max Jean-Joseph, Chapados Camille
ITF Labs, 400 Montpellier, Montréal, QC, Canada, H4N 2G7.
Appl Spectrosc. 2008 Oct;62(10):1167-71. doi: 10.1366/000370208786049132.
Faulty fringes coming from an infrared spectrometer may creep into a spectrum. Because these come from one faulty interferogram out of many used to obtain the spectrum, these may pass unnoticed. However, they cause some problems in the data treatment of factor analysis and other spectral analysis. We present a method for detecting the faulty fringes and give a simple method to eliminate them at the interferogram accumulation level.
来自红外光谱仪的错误条纹可能会混入光谱中。由于这些条纹来自用于获取光谱的众多干涉图中的一个错误干涉图,它们可能会未被注意到而通过。然而,它们在因子分析和其他光谱分析的数据处理中会引起一些问题。我们提出了一种检测错误条纹的方法,并给出了一种在干涉图累积水平上消除它们的简单方法。