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铁硫属化物玻璃离子选择性电极纳米结构的小角中子散射和电化学阻抗谱研究

A small angle neutron scattering and electrochemical impedance spectroscopy study of the nanostructure of the iron chalcogenide glass ion-selective electrode.

作者信息

Pejcic Bobby, Marco Roland De, Buckley Craig E, Maitland Clinton F, Knott Robert

机构信息

Department of Applied Chemistry, Curtin University of Technology, GPO Box U 1987, Perth 6845, WA, Australia.

出版信息

Talanta. 2004 May 10;63(1):149-57. doi: 10.1016/j.talanta.2003.11.025.

DOI:10.1016/j.talanta.2003.11.025
PMID:18969413
Abstract

This paper presents a preliminary structural and interfacial study of the iron chalcogenide glass [i.e., Fe(x)(Ge(28)Sb(12)Se(60))(100-x)] ion-selective electrode (ISE) using small angle neutron scattering (SANS) and electrochemical impedance spectroscopy (EIS). SANS detected variations in the neutron scattering as a function of iron content in the chalcogenide glass. Furthermore, a change in the chalcogenide glass structure was observed at elevated iron dopant levels. Conversely, EIS was used to show that the iron chalcogenide membrane comprises various time constants, and the interfacial charge transfer reaction depends on the membrane iron content. Equivalent circuit modeling revealed that the charge transfer resistance decreases at elevated iron levels, and this may be related to the presence of iron defects in the glass. It is proposed that the iron chalcogenide membrane comprises an iron nanostructural network embedded in the amorphous matrix, and this directly influences the electrical conductivity and concomitant electrochemical reactivity of the glass.

摘要

本文利用小角中子散射(SANS)和电化学阻抗谱(EIS)对硫族化物玻璃铁电极[即Fe(x)(Ge(28)Sb(12)Se(60))(100 - x)]进行了初步的结构和界面研究。SANS检测到硫族化物玻璃中中子散射随铁含量的变化。此外,在铁掺杂水平升高时观察到硫族化物玻璃结构的变化。相反,EIS用于表明硫族化物玻璃膜包含各种时间常数,并且界面电荷转移反应取决于膜中的铁含量。等效电路建模表明,铁含量升高时电荷转移电阻降低;这可能与玻璃中铁缺陷的存在有关。有人提出,硫族化物玻璃膜包含嵌入非晶基质中的铁纳米结构网络,这直接影响玻璃的电导率和伴随的电化学反应性。

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