Van Ham Rita, Van Vaeck Luc, Adriaens Annemie, Adams Freddy, Hodges Brittany, Gianotto Anita, Avci Recep, Appelhans Anthony, Groenewold Gary
Department of Chemistry, University of Antwerp, Universiteitsplein 1, Antwerp, Belgium.
Talanta. 2006 Mar 15;69(1):91-6. doi: 10.1016/j.talanta.2005.09.012. Epub 2005 Oct 20.
The feasibility of static secondary ion mass spectrometry (S-SIMS) for the detection of molecule specific information from complex materials, such as natural clay and soil samples, has been investigated. Ion trap (IT), as well as triple quadrupole (TQ) instruments, have been used for mass analysis. Secondary ion images have been acquired using time-of-flight (TOF) S-SIMS. The generation of molecular adduct ions from thin and thick layers on the mineral substrates has been investigated using KBr as a simple model system. Results show that molecular adducts of KBr can be indeed detected from the spiked materials. However, the concentrations of the spiking solutions have to be significantly larger than expected from the surface area measured by gas adsorption techniques. In addition imaging analysis has evidenced that the detection of adduct ions in the mass spectra directly relates to the presence of local micro-crystallites.
研究了静态二次离子质谱法（S-SIMS）用于检测复杂材料（如天然粘土和土壤样品）中分子特定信息的可行性。离子阱（IT）以及三重四极杆（TQ）仪器已用于质量分析。使用飞行时间（TOF）S-SIMS采集了二次离子图像。以KBr作为简单模型系统，研究了矿物基质上薄层和厚层分子加合离子的生成。结果表明，确实可以从加标材料中检测到KBr的分子加合物。然而，加标溶液的浓度必须显著高于通过气体吸附技术测量的表面积所预期的浓度。此外，成像分析证明，质谱中加合离子的检测与局部微晶的存在直接相关。
