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构型失真对随机点闪烁诱发的与面孔相关的事件相关电位的影响。

Effect of configural distortion on a face-related ERP evoked by random dots blinking.

作者信息

Miki Kensaku, Watanabe Shoko, Takeshima Yasuyuki, Teruya Mika, Honda Yukiko, Kakigi Ryusuke

机构信息

Department of Integrative Physiology, National Institute for Physiological Sciences, 38 Nishigonaka Myodaiji, Okazaki 444-8585, Japan.

出版信息

Exp Brain Res. 2009 Feb;193(2):255-65. doi: 10.1007/s00221-008-1617-0. Epub 2008 Nov 12.

Abstract

Using random dots blinking (RDB), which reflects the activity of the higher visual area related to face perception, the following stimuli were presented. (1) Upright: a schematic face; (2) Inverted: the Upright stimulus inverted; and (3) Scrambled: the same contour and features as in Upright but with the spatial relation distorted. Clear negative components (N-ERP250) were identified at approximately 250 ms after stimulus onset. At the T5 and T6 electrodes, the peak latency was significantly longer for Inverted and Scrambled than for Upright. At the P4 electrode, the maximum amplitude was significantly larger for Scrambled than for Upright and Inverted. These results indicate that the delayed latency for Inverted and Scrambled reflects the involvement of the additional analytic processing caused by the configural distortion, and that the increase in amplitude for Scrambled indicates the existence of further processing caused by the distortion of the spatial relationship between the contour and features.

摘要

使用反映与面部感知相关的高级视觉区域活动的随机点闪烁(RDB),呈现了以下刺激。(1)正立:一张示意性面孔;(2)倒立:正立刺激的倒置;(3)打乱:与正立具有相同的轮廓和特征,但空间关系扭曲。在刺激开始后约250毫秒时识别出明显的负成分(N-ERP250)。在T5和T6电极处,倒立和打乱刺激的峰值潜伏期明显长于正立刺激。在P4电极处,打乱刺激的最大振幅明显大于正立和倒立刺激。这些结果表明,倒立和打乱刺激潜伏期的延迟反映了由构型扭曲引起的额外分析处理的参与,而打乱刺激振幅的增加表明轮廓与特征之间空间关系的扭曲导致了进一步的处理。

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