Brundavanam Maruthi M, Viswanathan Nirmal K, Rao D Narayana
School of Physics, University of Hyderabad, Hyderabad 500046, India.
Appl Opt. 2008 Dec 1;47(34):6334-9. doi: 10.1364/ao.47.006334.
We report a novel experimental method to measure nanometer displacements using wavelength shifts of spectral peaks around spectral switch or singular phase points in the interference spectra due to temporal correlation in a Michelson interferometer illuminated by a broadband white-light source. Dramatic changes in the spectral characteristics are recorded as a function of path difference between the interfering beams around the spectral switch position. These are then compared with measurements far from it in order to demonstrate the higher sensitivities involved in the proposed method.
我们报告了一种新颖的实验方法，该方法利用在由宽带白光源照明的迈克尔逊干涉仪中，由于时间相关性导致干涉光谱中光谱开关或奇异相位点周围光谱峰的波长偏移来测量纳米级位移。记录干涉光束在光谱开关位置附近的光程差函数下光谱特性的显著变化。然后将这些变化与远离光谱开关位置的测量结果进行比较，以证明所提出方法具有更高的灵敏度。
