Yokoya A, Fuji K, Shikazono N, Akamatsu K, Urushibara A, Watanabe R
Advanced Science Research Center, Japan Atomic Energy Agency, Tokai, Ibaraki, Japan.
Int J Radiat Biol. 2008 Dec;84(12):1069-81. doi: 10.1080/09553000802534950.
To understand the characteristics of DNA damage induced by Auger effect in DNA by ultrasoft X-irradiation. In situ electron paramagnetic resonance (EPR) spectroscopy as well as biochemical analysis has been applied to examine the DNA damage induction in both viewpoints of intermediate species and final products.
Unpaired electron species induced in a calf thymus DNA film irradiated with monochromatic ultrasoft X-rays (270-580 eV) was observed using an X-band EPR spectrometer installed in a synchrotron beamline. To determine the yield of single strand break (SSB), pUC18 plasmid DNA was irradiated and then analyzed by agarose gel electrophoresis. To analyze molecular change in a single strand DNA, a new technique using DNA-denaturation-treatment has been applied to quantify multiple SSB arising in both DNA strands.
Short-lived EPR spectra were observed during irradiation. The intensity of transient EPR spectrum shows the similar energy dependence with that of the SSB yield around oxygen K-edge in particular. The fraction of the single-strand plasmid DNA (SS-DNA) after irradiation could be determined using a low-temperature-denaturation condition. The obtained slope of the dose-response for SS-DNA shows half of that of closed circular DNA as expected under the diluted solution condition.
The availability of an EPR apparatus installed in a synchrotron beamline is demonstrated by detecting very short-lived unpaired electron species. Transient EPR spectra of DNA show the similar energy dependence to that of the SSB yield. The proposed DNA-denaturation assay works as expected using the low-temperature-denaturation condition.
了解超软X射线照射导致DNA中俄歇效应所引起的DNA损伤特征。已应用原位电子顺磁共振(EPR)光谱以及生化分析,从中介物种和最终产物两个角度来检测DNA损伤的诱导情况。
使用安装在同步加速器光束线上的X波段EPR光谱仪,观察用单色超软X射线(270 - 580 eV)照射小牛胸腺DNA薄膜时诱导产生的未配对电子物种。为了确定单链断裂(SSB)的产率,对pUC18质粒DNA进行照射,然后通过琼脂糖凝胶电泳进行分析。为了分析单链DNA中的分子变化,已应用一种使用DNA变性处理的新技术来量化两条DNA链中产生的多个SSB。
在照射过程中观察到了短暂的EPR光谱。瞬态EPR光谱的强度尤其显示出与氧K边附近SSB产率相似的能量依赖性。照射后单链质粒DNA(SS - DNA)的比例可以使用低温变性条件来确定。在稀释溶液条件下,获得的SS - DNA剂量响应斜率显示为闭环DNA斜率的一半,正如预期的那样。
通过检测寿命极短的未配对电子物种,证明了安装在同步加速器光束线上的EPR仪器的可用性。DNA的瞬态EPR光谱显示出与SSB产率相似的能量依赖性。所提出的DNA变性测定在使用低温变性条件时按预期起作用。