Fujii Masafumi, Freude Wolfgang, Leuthold Juerg
Department of Electric, Electronic and System Engineering, University of Toyama, 3190 Gofuku, Toyama, 930-8555 Japan.
Opt Express. 2008 Dec 8;16(25):21039-52. doi: 10.1364/oe.16.021039.
Sub-diffraction-limit imaging by the surface plasmon polariton (SPP) induced in thin metal film lenses has been analyzed numerically. The SPP images are deteriorated by interference of plasmon fields in layered metal-dielectric structures. To obtain a clear imaging capability, the reflection and the transmission property of evanescent waves in the layered structures has been investigated by the finite-difference time-domain (FDTD) method. For verification, a full 3-dimensional analysis of large-scale layered structures demonstrated sub-wavelength images similar to those obtained in the recently reported experiments. The analysis has been extended further to a lithography of nano-scale images to predict the minimum possible size of the images resolved by the silver thin film lenses.
通过数值分析了薄金属膜透镜中诱导产生的表面等离激元极化激元(SPP)实现的亚衍射极限成像。在分层金属 - 电介质结构中,表面等离激元场的干涉会使表面等离激元图像质量下降。为了获得清晰的成像能力,采用时域有限差分(FDTD)方法研究了分层结构中倏逝波的反射和透射特性。为进行验证,对大规模分层结构进行了全三维分析,得到了与最近报道的实验中类似的亚波长图像。该分析进一步扩展到纳米尺度图像的光刻,以预测银薄膜透镜分辨的图像的最小可能尺寸。