Chin E, Palmans H, Shipley D, Bailey M, Verhaegen F
Medical Physics Unit, McGill University, Montreal General Hospital, 1650 Cedar Avenue, Montreal, Quebec H3G 1A4, Canada.
Phys Med Biol. 2009 Jan 21;54(2):307-26. doi: 10.1088/0031-9155/54/2/009. Epub 2008 Dec 19.
For well-guarded plane-parallel ionization chambers, international dosimetry protocols recommend a value of unity for electron perturbation factors in water. However, recent data published by various groups have challenged this. Specifically for the NACP-02 chamber, non-unity electron perturbation factors have already been published by Verhaegen et al (2006 Phys. Med. Biol. 51 1221-35) and Buckley and Rogers (2006 Med. Phys. 33 1788-96). Recently it was found that the mass thickness of the front chamber window can be 35% greater than is listed in the IAEA's TRS-398 absorbed dose protocol (Chin et al 2008 Phys. Med. Biol. 53 N119-26). This study therefore recalculated NACP-02 electron perturbation correction factors for energies 4-18 MeV at depths z(ref) and R(50) to determine the effect of the chamber model change. Results showed that perturbation factors at z(ref) are fairly stable for similar chamber models but become highly sensitive to small changes at deeper depths. The results also showed some dependence on using 1 keV versus 10 keV for the transport cut-off. Additional investigations revealed that the wall perturbation factor, p(wall), is strongly influenced by the chamber back wall at z(ref) and at larger depths small changes in the positioning of the effective point of measurement cause large fluctuations in the final value. Finally, the cavity perturbation factor, p(cav), was found to be primarily influenced by electron backscatter.
对于防护良好的平行板电离室,国际剂量学协议推荐水中电子扰动因子的值为1。然而,各研究小组最近发表的数据对此提出了质疑。特别是对于NACP - 02电离室,Verhaegen等人(2006年,《物理医学与生物学》,第51卷,第1221 - 35页)以及Buckley和Rogers(2006年,《医学物理》,第33卷,第1788 - 96页)已经发表了非单位电子扰动因子。最近发现,前电离室窗口的质量厚度可能比国际原子能机构TRS - 398吸收剂量协议中列出的值大35%(Chin等人,2008年,《物理医学与生物学》,第53卷,N119 - 26)。因此,本研究重新计算了在深度z(ref)和R(50)处4 - 18 MeV能量下NACP - 02的电子扰动校正因子,以确定电离室模型变化的影响。结果表明,对于相似的电离室模型,z(ref)处的扰动因子相当稳定,但在更深的深度对小变化变得高度敏感。结果还显示出对使用1 keV与10 keV作为输运截止能量存在一定依赖性。进一步的研究表明,壁扰动因子p(wall)在z(ref)处受电离室后壁强烈影响,在更大深度处,有效测量点位置的微小变化会导致最终值的大幅波动。最后,发现腔扰动因子p(cav)主要受电子背散射影响。