Lee Sukmock, Sasian Jose
Department of Physics, Inha University, Incheon, Republic of Korea.
Opt Express. 2009 Feb 2;17(3):1854-8. doi: 10.1364/oe.17.001854.
We observe a non-complementary dark-space produced when two Ronchi-grams, at zero-phase and pi-phase, are overlapped and use these dark spaces to quantify Ronchi-grams. Diffraction and multiple beam interference effects narrow the Ronchi fringes created with a coherent point source illumination and prevent accurate determination of the geometrical fringe edges. The dark spaces created when the intensity of two Ronchi grams is added allow assessing the geometrical edge at the dark space middle providing a way to reduce measurement errors. We re-construct the wavefront deformation in a test beam with a 35-term Zernike polynomial.
我们观察到当两个处于零相位和π相位的朗奇光栅重叠时产生的非互补暗区,并利用这些暗区来量化朗奇光栅。衍射和多光束干涉效应会使相干点源照明产生的朗奇条纹变窄,从而妨碍对几何条纹边缘的精确测定。将两个朗奇光栅的强度相加时产生的暗区能够在暗区中间评估几何边缘,提供了一种减少测量误差的方法。我们用35项泽尼克多项式重建测试光束中的波前变形。