Tison Yann, Giusca Cristina E, Sloan Jeremy, Silva S Ravi P
Nano-Electronics Centre, Advanced Technology Institute, University of Surrey, Guildford, Surrey, United Kingdom.
ACS Nano. 2008 Oct 28;2(10):2113-20. doi: 10.1021/nn800483k.
Prior to the implementation of multi-walled carbon nanotubes in microelectronic devices, investigating their electronic structure down to the nanometer scale is necessary. In that prospect, we used scanning tunneling microscopy (STM) to study the detailed atomic scale structure of double-walled carbon nanotubes, each comprising two rolled monolayers of graphene. Atomically resolved STM images usually displayed a motif and periodicity similar to that found in graphite but, on selected regions, atomically resolved motifs with a clearly defined superstructure were observed. This phenomenon has been reported previously but without a suitable explanation. We discuss the origin of this behavior in terms of modified stacking sequences due to the mismatch in registry between the chiral angles of the inner and the outer shells, associated with the interaction between the two carbon monolayers. These phenomena must be taken into account for the realization of lateral interference devices based on carbon nanotubes or graphene layers.
在将多壁碳纳米管应用于微电子器件之前，有必要研究其在纳米尺度下的电子结构。基于此，我们使用扫描隧道显微镜（STM）来研究双壁碳纳米管的详细原子尺度结构，每个双壁碳纳米管由两个石墨烯卷曲单层组成。原子分辨的STM图像通常显示出与石墨中相似的图案和周期性，但在选定区域，观察到具有明确超结构的原子分辨图案。此前已有关于这种现象的报道，但没有合适的解释。我们从内壳和外壳手性角配准不匹配导致的堆叠序列改变方面讨论这种行为的起源，这与两个碳单层之间的相互作用有关。对于基于碳纳米管或石墨烯层的横向干涉器件的实现，必须考虑这些现象。
