Bumm Lloyd A
Homer L. Dodge Department of Physics and Astronomy, The University of Oklahoma, 440 West Brooks Street, Norman, Oklahoma 73019-2061, USA.
ACS Nano. 2008 Mar;2(3):403-7. doi: 10.1021/nn8001246.
Accurate measurements of electronic properties of molecular junctions are important for both fundamental and practical applications. Often the molecule-electrode contacts are poorly characterized, leading to wide variation in the measured resistance values. A new paper in this issue demonstrates the use of a reference molecule as an internal standard to compensate for the varying conditions of the molecular contact in conductive-tip atomic force microscopy measurements and yields consistent resistances relative to the reference despite variations in absolute resistance.
准确测量分子结的电学性质对于基础研究和实际应用都很重要。通常分子与电极的接触情况表征不佳，导致测量的电阻值差异很大。本期的一篇新论文展示了使用参考分子作为内标，以补偿导电尖端原子力显微镜测量中分子接触条件的变化，并且尽管绝对电阻存在变化，但相对于参考物仍能得出一致的电阻值。
Zotero 插件