Taguchi Mitsumasa, Kimura Atsushi, Watanabe Ritsuko, Hirota Koichi
Organic Pollutant Removal Technology Group, Environment and Industrial Materials Research Division, Quantum Beam Science Directorate, Japan Atomic Energy Agency, 1233 Watanuki, Takasaki, Gunma, 370-1292, Japan.
Radiat Res. 2009 Feb;171(2):254-63. doi: 10.1667/RR1445.1.
This article reports the determination of yields of OH (hydroxyl) radicals in water irradiated with helium, carbon, neon and argon ions ranging from 2 to 18 MeV/nucleon. The yields of the OH radicals depend on the atomic number and energy of the incident ion and the reaction time just after the irradiation based on the track structure theory. The yields of the OH radicals estimated by analyzing the yields of the irradiation products from phenol were at almost 0 to 3.1 per 100 eV absorbed energy on a time scale from 0.75 to 300 ns and were lower than the corresponding ones after exposure to low-LET radiation. The yields of OH radicals decreased with decreasing specific energy for each ion, with increasing atomic number of each ion at a similar specific energy, and with the average reaction time after irradiation. In addition, Monte Carlo simulations were conducted and compared with the OH radical yields obtained experimentally.
本文报道了在2至18 MeV/核子的氦、碳、氖和氩离子辐照水中羟基(OH)自由基产额的测定。基于径迹结构理论,OH自由基的产额取决于入射离子的原子序数和能量以及辐照后的反应时间。通过分析苯酚辐照产物的产额估算出的OH自由基产额,在0.75至300 ns的时间尺度上,每100 eV吸收能量约为0至3.1,且低于低传能线密度辐射后的相应产额。对于每种离子,OH自由基产额随比能降低、在相似比能下随离子原子序数增加以及辐照后的平均反应时间而降低。此外,还进行了蒙特卡罗模拟,并与实验获得的OH自由基产额进行了比较。