Rupp C J, Rossato J, Baierle R J
Departamento de Fisica, Universidade Federal de Santa Maria, 97105-900 Santa Maria, Rio Grande do Sul, Brazil.
J Chem Phys. 2009 Mar 21;130(11):114710. doi: 10.1063/1.3089357.
Spin polarized density functional theory is used to investigate the incorporation of substitutional Si atoms in the zigzag (5,0) and in the armchair (3,3) BC(2)N nanotubes (NTs). Our results show that the Si impurities in BC(2)N NTs have lower formation energy when compared to Si in carbon and boron nitride NTs. In neutral charge state, Si in the boron site (Si(B)) presents a spin split with two electronic levels within the NT band gap and it gives rise to a net spin magnetic moment net of 1mu(B). Si in the nitrogen site (Si(N)) introduces electronic levels near the top of the valence band that lead the system to exhibit acceptor properties, which suggest the formation of defect-induced type-p BC(2)N NTs. The defective levels for Si in the two nonequivalent carbon atom sites (Si(CI) and Si(CII)) are resonant with the valence and conduction bands, respectively. The calculations of formation energy in charge state show that for all the available values of the electronic chemical potential, Si(CI) and Si(CII) have lower formation energy in neutral charge state, while Si(B) and Si(N) present lower formation energy in neutral or single negative charge state depending on the position of the electronic chemical potential.
自旋极化密度泛函理论被用于研究锯齿形(5,0)和扶手椅形(3,3)BC₂N纳米管(NTs)中替代硅原子的掺入情况。我们的结果表明,与碳纳米管和氮化硼纳米管中的硅相比,BC₂N纳米管中的硅杂质具有更低的形成能。在中性电荷状态下,硼位点的硅(Si(B))呈现出自旋分裂,在纳米管带隙内有两个电子能级,并且产生了1μB的净自旋磁矩。氮位点的硅(Si(N))在价带顶部附近引入电子能级,导致系统表现出受主特性,这表明形成了缺陷诱导型p型BC₂N纳米管。两个不等价碳原子位点的硅(Si(CI)和Si(CII))的缺陷能级分别与价带和导带共振。电荷状态下形成能的计算表明,对于电子化学势的所有可用值,Si(CI)和Si(CII)在中性电荷状态下具有更低的形成能,而Si(B)和Si(N)根据电子化学势的位置在中性或单负电荷状态下具有更低的形成能。