Zhang C-H, Thumm U
Department of Physics, Kansas State University, Manhattan, Kansas 66506, USA.
Phys Rev Lett. 2009 Mar 27;102(12):123601. doi: 10.1103/PhysRevLett.102.123601. Epub 2009 Mar 25.
Recent attosecond-streaking spectroscopy experiments [A. L. Cavalieri, Nature (London) 449, 1029 (2007)10.1038/nature06229] using copropagating extreme ultraviolet (XUV) and infrared (IR) pulses of variable relative delay have measured a delay of approximately 100 attoseconds between photoelectrons emitted by a single XUV photon from localized core states and delocalized conduction-band states of a tungsten surface. We analyze the underlying XUV-photoemission-IR-streaking mechanism by combining a perturbative description of the XUV-photoemission process and the subsequent nonperturbative IR streaking of the photoelectrons. Our calculated time-resolved photoelectron spectra agree with the experiments of Cavalieri et al. and demonstrate that the observed temporal shift is caused by the interference of core-level photoelectrons that originate in different layers of the solid.
最近利用具有可变相对延迟的共传播极紫外(XUV)和红外(IR)脉冲进行的阿秒条纹光谱实验 [A. L. 卡瓦列里,《自然》(伦敦)449, 1029 (2007)10.1038/nature06229] 测量了来自钨表面局域芯态和离域导带态的单个XUV光子发射的光电子之间约100阿秒的延迟。我们通过结合XUV光发射过程的微扰描述和光电子随后的非微扰IR条纹,分析了潜在的XUV光发射 - IR条纹机制。我们计算的时间分辨光电子能谱与卡瓦列里等人的实验结果一致,并表明观察到的时间偏移是由源自固体不同层的芯能级光电子的干涉引起的。