de Oliveira N, Joyeux D, Phalippou D, Rodier J C, Polack F, Vervloet M, Nahon L
Synchrotron Soleil, Orme des Merisiers, St AUBIN BP 48, 91192 GIF sur Yvette CEDEX, France.
Rev Sci Instrum. 2009 Apr;80(4):043101. doi: 10.1063/1.3111452.
We describe a Fourier transform (FT) spectrometer designed to operate down to 60 nm (20 eV) on a synchrotron radiation beamline for high resolution absorption spectrometry. As far as we know, such an instrument is not available below 140 nm mainly because manufacturing accurate and efficient beam splitters remains a major problem at these wavelengths, especially if a wide bandwidth operation is desired. In order to overcome this difficulty, we developed an interferometer based on wave front division instead of amplitude division. It relies on a modified Fresnel bimirror configuration that requires only flat mirrors. The instrument provides path difference scanning through the translation of one reflector. During the scanning, the moving reflector is controlled by an optical system that keeps its direction constant within a tolerable value and provides an accurate interferometric measurement of the path difference variation. Therefore, a regular interferogram sampling is obtained, producing a nominal spectral impulse response and an accurate spectral calibration. The first results presented in this paper show a measured spectral resolution of delta(sigma)=0.33 cm-1 (interval between spectral samples). This was obtained with a sampling interval of 29 nm (path difference) and 512 K samples from a one-sided interferogram using a cosine FT. Such a sampling interval should allow the recording of large bandwidth spectra down to lambda=58 nm with an ultimate resolving power of 500,000 at this wavelength. In order to check the instrument performances, we first recorded an interferogram from a He-Ne stabilized laser. This provided the actual spectral impulse function, which was found to be fully satisfactory. The determination of the impulse response distortion and of the noise on the vacuum ultraviolet (VUV) spectral range provided accurate information in the sampling error profile over a typical scan. Finally, the instrument has been moved to the SU5 undulator-based synchrotron radiation beamline (Super-ACO facility, LURE, Orsay, France). A high resolution spectrum of O2 (the Schumann-Runge absorption bands, 185-200 nm) was computed from recorded interferograms using the beamline monochromator at the zeroth order to feed the instrument with an 11% relative bandwidth "white" beam (2003). These UV measurements are very close to those found in the literature, showing nominal performances of the FT spectrometer that should translate into an unprecedented resolving power at shortest VUV wavelengths. A recent upgrade (2007) and future developments will be discussed in light of the current installation of the upgraded FT spectrometer as a permanent endstation for ultrahigh resolution absorption spectrometry on the VUV beamline DESIRS at SOLEIL, the new French third generation synchrotron facility.
我们描述了一种傅里叶变换(FT)光谱仪,其设计用于在同步辐射光束线上运行至60纳米(20电子伏特),以进行高分辨率吸收光谱分析。据我们所知,在140纳米以下没有这样的仪器,主要是因为制造精确且高效的分束器在这些波长下仍然是一个主要问题,特别是如果需要宽带宽操作的话。为了克服这一困难,我们开发了一种基于波前分割而非振幅分割的干涉仪。它依赖于一种改进的菲涅耳双镜配置,只需要平面镜。该仪器通过一个反射镜的平移来提供光程差扫描。在扫描过程中,移动反射镜由一个光学系统控制,该系统将其方向保持在可容忍值内,并对光程差变化进行精确的干涉测量。因此,获得了规则的干涉图采样,产生了标称的光谱脉冲响应和精确的光谱校准。本文给出的初步结果显示,测量的光谱分辨率为δ(σ)=0.33厘米-1(光谱样本之间的间隔)。这是在29纳米(光程差)的采样间隔和使用余弦傅里叶变换从单边干涉图中获取512K个样本的情况下得到的。这样的采样间隔应该能够记录低至λ=58纳米的大带宽光谱,在该波长下具有500,000的极限分辨能力。为了检验仪器性能,我们首先从一台氦氖稳频激光器记录了一张干涉图。这提供了实际的光谱脉冲函数,结果发现完全令人满意。对真空紫外(VUV)光谱范围内的脉冲响应失真和噪声的测定,在典型扫描过程中提供了采样误差分布的准确信息。最后,该仪器已被转移到基于SU5波荡器的同步辐射光束线(法国奥赛LURE的Super-ACO设施)。利用光束线零级单色仪从记录的干涉图中计算出了O2的高分辨率光谱(舒曼-朗格吸收带,185 - 200纳米),以便为该仪器提供相对带宽为11%的“白色”光束(2003年)。这些紫外测量结果与文献中的结果非常接近,表明该傅里叶变换光谱仪的标称性能在最短的真空紫外波长下应能转化为前所未有的分辨能力。鉴于升级后的傅里叶变换光谱仪目前已作为法国新的第三代同步加速器设施SOLEIL的VUV光束线DESIRS上超高分辨率吸收光谱分析的永久终端站安装完成,将讨论其最近的一次升级(2007年)以及未来的发展情况。