Rousseau F, Heitz D, Biancalana V, Blumenfeld S, Kretz C, Boué J, Tommerup N, Van Der Hagen C, DeLozier-Blanchet C, Croquette M F
Institut National de la Santé et de la Recherche Médicale (INSERM), Unité 184, Strasbourg, France.
N Engl J Med. 1991 Dec 12;325(24):1673-81. doi: 10.1056/NEJM199112123252401.
The fragile X syndrome, the most common form of inherited mental retardation, is caused by mutations that increase the size of a specific DNA fragment of the X chromosome (in Xq27.3). Affected persons have both a full mutation and abnormal DNA methylation. Persons with a smaller increase in the size of this DNA fragment (a premutation) have little or no risk of retardation but are at high risk of having affected children or grandchildren. The passage from premutation to full-mutation status occurs only with transmission from the mother. We have devised a method of identifying carriers of these mutations by direct DNA analysis.
We studied 511 persons from 63 families with the fragile X syndrome. Mutations and abnormal methylation were detected by Southern blotting with a probe adjacent to the mutation target. Analysis of EcoRI and EagI digests of DNA distinguished clearly in a single test between the normal genotype, the premutation, and the full mutation.
DNA analysis unambiguously established the genetic status at the fragile X locus for all samples tested. This method was much more powerful and reliable than cytogenetic testing or segregation studies with closely linked polymorphic markers. The frequency of mental retardation in persons with premutations was similar to that in the general population, whereas all 103 males and 31 of 59 females with full mutations had mental retardation. About 15 percent of those with full mutations had some cells carrying only the premutation. All the mothers of affected children were carriers of either a premutation or a full mutation.
Direct diagnosis by DNA analysis is now an efficient and reliable primary test for the diagnosis of the fragile X syndrome after birth, as well as for prenatal diagnosis and genetic counseling.
脆性X综合征是遗传性智力迟钝最常见的形式,由X染色体特定DNA片段(Xq27.3)大小增加的突变引起。患者既有完全突变又有异常的DNA甲基化。该DNA片段大小增加较小(前突变)的人智力迟钝风险很小或没有,但生育患病子女或孙子女的风险很高。从前突变状态转变为完全突变状态仅在母亲传递时发生。我们设计了一种通过直接DNA分析来识别这些突变携带者的方法。
我们研究了来自63个脆性X综合征家庭的511人。通过用与突变靶点相邻的探针进行Southern印迹检测突变和异常甲基化。对DNA的EcoRI和EagI酶切分析在一次检测中就能清楚地区分正常基因型、前突变和完全突变。
DNA分析明确确定了所有检测样本在脆性X位点的遗传状态。该方法比细胞遗传学检测或使用紧密连锁多态性标记的连锁分析更有效、更可靠。前突变者的智力迟钝发生率与一般人群相似,而所有103名男性和59名女性中的31名完全突变者都有智力迟钝。约15%的完全突变者有一些细胞仅携带前突变。患病儿童的所有母亲都是前突变或完全突变的携带者。
DNA分析直接诊断现在是出生后脆性X综合征诊断、产前诊断和遗传咨询的一种高效、可靠的主要检测方法。