Lin Chien-I, Gaylord Thomas K
School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0250, USA.
Appl Opt. 2009 Jul 1;48(19):3603-13. doi: 10.1364/ao.48.003603.
Leaky planar waveguides are critically important to the operation of present day and future integrated photonic circuits. However, to incorporate these waveguides successfully into practical photonic circuits requires an accurate knowledge of their attenuation and mode profile in operation. In contrast with previous numerical methods for obtaining leaky waveguide characteristics, which usually involve complicated algorithms to solve for the complex roots of boundary conditions, the transverse transmission/reflection (TTR) method presented here provides a straightforward and simple approach by simulating the corresponding coupled-waveguide structure. By adding a high-index layer adjacent to the cover to enable the coupling, the transmission/reflection coefficients are shown to be definitively expressed in the form of a Lorentzian that is directly related to the complex propagation constant of leaky/lossy mode. The TTR method simultaneously determines the mode profile of the leaky/lossy mode via the angle of incidence for resonant transmission/reflection. In the present work, the TTR method is applied to an antiresonant reflection optical waveguide (ARROW), a lossy waveguide structure, and a waveguide structure that is simultaneously leaky and lossy.
泄漏平面波导对于当今和未来的集成光子电路的运行至关重要。然而,要将这些波导成功纳入实际光子电路,需要准确了解其在运行中的衰减和模式分布。与以往获取泄漏波导特性的数值方法不同,以往的方法通常涉及复杂算法来求解边界条件的复根,而本文提出的横向传输/反射(TTR)方法通过模拟相应的耦合波导结构提供了一种直接且简单的方法。通过在覆盖层附近添加高折射率层以实现耦合,传输/反射系数被证明可以明确地以洛伦兹形式表示,该形式与泄漏/损耗模式的复传播常数直接相关。TTR方法通过共振传输/反射的入射角同时确定泄漏/损耗模式的模式分布。在本工作中,TTR方法被应用于反共振反射光波导(ARROW)、有损波导结构以及同时具有泄漏和损耗的波导结构。