Lin Chien-I, Gaylord Thomas K
School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332-0250, USA.
Appl Opt. 2010 Feb 20;49(6):936-44. doi: 10.1364/AO.49.000936.
Metal-insulator-metal (MIM) structures have been the subject of great interest as nanoscale plasmonic waveguides. The modeling and measurement of the loss in these waveguides is one of the critical issues in realizing the plasmon-based nanocircuitry. Due to the subwavelength size of the structure, the light injection and the measurement of the loss in MIM structures typically require tapered fibers or waveguides, as well as multiple waveguide structures with various length scales 8 9 or scanning near-field optical microscopy. The transverse transmission/reflection (TTR) method is presented for determining the loss of plasmonic modes in MIM waveguides. The approach is based on determining the width of the reflection angular spectrum in the attenuated total reflection configuration. Owing to its transverse character, the TTR method potentially provides a more straightforward and simpler way to determine the loss of plasmonic modes in MIM structures.
金属-绝缘体-金属（MIM）结构作为纳米级等离子体波导一直备受关注。这些波导中损耗的建模与测量是实现基于等离子体的纳米电路的关键问题之一。由于结构的亚波长尺寸，在MIM结构中注入光以及测量损耗通常需要锥形光纤或波导，以及具有各种长度尺度的多个波导结构8 9或扫描近场光学显微镜。本文提出了一种横向透射/反射（TTR）方法来确定MIM波导中等离子体模式的损耗。该方法基于确定衰减全反射配置下反射角谱的宽度。由于其横向特性，TTR方法可能提供一种更直接、更简单的方法来确定MIM结构中等离子体模式的损耗。
