Shahid Muhammad, Mazhar Muhammad, Hamid Mazhar, O'Brien Paul, Malik Mohammad A, Helliwell Madeleine, Raftery James
Department of Chemistry, Quaid-I-Azam University, Islamabad, 45320, Pakistan.
Dalton Trans. 2009 Jul 28(28):5487-94. doi: 10.1039/b903406d. Epub 2009 May 28.
Two heterobimetallic precursors [Zn(TFA)3(micro-OH)Cu3(dmae)3Cl].THF (1) and [Zn(TFA)4Cu3(dmae)4] (2) [dmae=N,N-dimethylaminoethanolate and TFA=trifluoroacetate], have been synthesized and characterized by their melting points, elemental analysis, FT-IR spectroscopy, mass spectrometry, TGA and single crystal X-ray diffraction methods. Both complexes were used to deposit thin films of Cu-ZnO composite on glass substrates by aerosol assisted chemical vapor deposition (AACVD) method. The films were characterized by "scotch tape" test for adhesion, thickness measurement as a function of temperature, EDX for composition, SEM for surface morphology and XRD for crystalline phases. Thin film deposition studies at 250, 325, 400, 475 degrees C indicated the increase in thickness with temperature reaching a maximum at 400 degrees C and then decreasing. EDX and PXRD results showed the uniform distribution of cubic metallic copper and hexagonal zinc oxide phases which make them useful for nanocatalysis on structured surfaces.
合成了两种异双金属前体[Zn(TFA)3(μ-OH)Cu3(dmae)3Cl].THF (1)和[Zn(TFA)4Cu3(dmae)4] (2) [dmae = N,N-二甲基氨基乙醇酸盐,TFA = 三氟乙酸盐],并通过熔点、元素分析、傅里叶变换红外光谱、质谱、热重分析和单晶X射线衍射方法对其进行了表征。两种配合物均通过气溶胶辅助化学气相沉积(AACVD)法用于在玻璃基板上沉积Cu-ZnO复合材料薄膜。通过“胶带”附着力测试、厚度随温度变化的测量、能谱分析成分、扫描电子显微镜观察表面形貌以及X射线衍射分析晶相来对薄膜进行表征。在250、325、400、475℃下进行的薄膜沉积研究表明,薄膜厚度随温度升高而增加,在400℃时达到最大值,然后减小。能谱分析和粉末X射线衍射结果表明立方金属铜和六方氧化锌相分布均匀,这使得它们在结构化表面的纳米催化中具有应用价值。