Jradi K, Bistac S, Schmitt M, Schmatulla A, Reiter G
COBM-ENSCMu, 12 rue des Frères Lumière, 68093 Mulhouse cedex, France.
Eur Phys J E Soft Matter. 2009 Aug;29(4):383-9. doi: 10.1140/epje/i2009-10480-0. Epub 2009 Aug 5.
We used the tip of an atomic force microscope (AFM) in the contact mode to scratch/rub the surface of a glassy polymer thin film, i.e., isotactic polystyrene (i-PS) at room temperature. After subsequent isothermal crystallization, an extremely high nucleation density of edge-on crystals within the rubbed region or at the edge of the scratched area was observed. Furthermore, a transition from edge-on to flat-on lamellae occurred beyond a certain distance from the edge of the scratched region. Our results demonstrate that both, soft rubbing or hard scratching, allow to lower the nucleation barrier for polymer crystallization and to control the orientation of the resulting crystalline lamellae. The role of scratching/rubbing on chain deformation and its relation to nucleation and crystal orientation in polymer thin films is discussed.
我们在室温下使用原子力显微镜(AFM)的尖端,以接触模式刮擦/摩擦玻璃态聚合物薄膜的表面,即全同立构聚苯乙烯(i-PS)。经过随后的等温结晶后,在摩擦区域内或刮擦区域边缘观察到极高密度的边缘取向晶体成核。此外,在距刮擦区域边缘一定距离之外,发生了从边缘取向片晶到平面取向片晶的转变。我们的结果表明,无论是软摩擦还是硬刮擦,都能够降低聚合物结晶的成核势垒,并控制所得结晶片晶的取向。讨论了刮擦/摩擦对聚合物薄膜中链变形的作用及其与成核和晶体取向的关系。