INRA, UMR 1208, Ingénierie des Agropolymères et Technologies Emergentes, 2 Place Pierre Viala,F-34060 Montpellier Cedex 1, France.
Food Addit Contam Part A Chem Anal Control Expo Risk Assess. 2009 Apr;26(4):487-95. doi: 10.1080/02652030802382717.
The milling behaviour of two naturally infected samples of durum wheat grain with contrasting levels of mycotoxins was studied. Although the two samples showed a similar milling behaviour, an increase of approximately 20% in deoxynivalenol (DON) levels was found in semolina from the sample containing the higher level of mycotoxin. However, even if the highest concentration of DON was found in fractions originating from the grain outer layers, the mycotoxin contamination in semolina and flours were not related to the amount of two compounds (ash or phytic acid) used to monitor these external tissues. The presence of the trichothecene-producing fungi in the inner-most semolina fraction was also shown using specific DNA primers and PCR amplification. Comparison of DON concentrations in the feed stock and corresponding output at each milling step or grinding of semolina fractions followed by sizing showed that concentration of mycotoxin occurs in the finest particles at the first processing steps. Therefore, DON contamination of milling fractions is not simply due to the presence of peripheral grain tissues.
研究了两个天然感染的硬质小麦籽粒样本的磨粉行为,这两个样本具有不同水平的霉菌毒素。尽管两个样本表现出相似的磨粉行为,但在含有更高水平霉菌毒素的样本的粗粒粉中发现脱氧雪腐镰刀菌烯醇(DON)水平增加了约 20%。然而,即使在源自谷物外层的馏分中发现了 DON 的最高浓度,粗粒粉和面粉中的霉菌毒素污染也与用于监测这些外部组织的两种化合物(灰分或植酸)的含量无关。使用特定的 DNA 引物和 PCR 扩增也表明,在最内层的粗粒粉馏分中存在产三烯镰刀菌的真菌。比较饲料原料和每个磨粉步骤或粗粒粉馏分研磨后的相应输出物中的 DON 浓度,以及随后的粒度分析表明,在最初的加工步骤中,霉菌毒素存在于最细的颗粒中。因此,磨粉馏分中的 DON 污染不仅仅是由于外围谷物组织的存在。