Measurement of structural changes in tetragonal PZT ceramics under static and cyclic electric fields using a laboratory X-ray diffractometer.

In situ structural characterization techniques that are capable of characterizing piezoelectric ceramics under different electrical loading conditions are important to understand the behavior of materials during their use. In this work, we report the use of a laboratory X-ray diffractometer for the measurement of various structural changes in tetragonal La-doped lead zirconate titanate (PZT) ceramics under the application of static and cyclic electric fields. The changes in the volume fractions of the 90 degrees domains parallel to the electric field direction are calculated from the intensities of the {002} diffraction peaks. In addition, the components of lattice strains are monitored from the changes in the (111) crystallographic planes. It is observed that, under the application of static electric fields, both 90 degrees domain switching and the 111 lattice strains showed similarity with the macroscopic strain-electric field hystersis loop. To measure the structural changes under cyclic electric fields, a time-resolved X-ray diffraction technique was used. Under application of a square-wave electric field of amplitude +/-650 V/mm and frequency 0.3 Hz, a change of approximately 5% in the volume fraction of the 90 degrees domains and approximately 0.07% strain of the 111 lattice planes are observed. Both the amount of 90 degrees domain switching and the 111 lattice strains are observed to increase with an increase in the amplitude of the cyclic electric field. The implications of the measured structural changes for the macroscopic piezoelectric properties of ceramics are discussed.