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光纤的精确横截面应力剖析。

Accurate cross-sectional stress profiling of optical fibers.

作者信息

Hutsel Michael R, Ingle Reeve, Gaylord Thomas K

机构信息

School of Electrical and Computer Engineering, Georgia Institute of Technology, 777 Atlantic Drive, N.W., Atlanta, Georgia 30332-0250, USA.

出版信息

Appl Opt. 2009 Sep 10;48(26):4985-95. doi: 10.1364/AO.48.004985.

Abstract

A novel technique for determining two-dimensional, cross-sectional stress distributions in optical fibers and fiber-based devices is presented. Use of the Brace-Köhler compensator technique and a polarization microscope for the measurement of retardation due to stress-induced birefringence is described, along with the tomographic reconstruction process for the determination of stress. Measurements are performed on Corning SMF-28 fiber in an unperturbed section, a section near a cleaved end-face, and a section exposed to CO2 laser radiation. Cross-sectional stress distributions are presented. Stress relaxation is quantified in the cleaved fiber and the fiber exposed to CO2 laser radiation.

摘要

本文提出了一种用于确定光纤及基于光纤的器件中二维横截面应力分布的新技术。描述了使用布雷斯 - 克勒补偿器技术和偏振显微镜测量应力诱导双折射引起的相位延迟,以及用于确定应力的断层重建过程。对康宁SMF - 28光纤在未受扰动的部分、靠近劈开端面的部分以及暴露于二氧化碳激光辐射的部分进行了测量。给出了横截面应力分布。对劈开的光纤和暴露于二氧化碳激光辐射的光纤中的应力松弛进行了量化。

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