Downing Kenneth H, McCartney M R, Glaeser Robert M
Life Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720-0001, USA.
Microsc Microanal. 2004 Dec;10(6):783-9. doi: 10.1017/s143192760404067x.
Specimen charging may be one of the most significant factors that contribute to the high variability and generally low quality of images in cryo-electron microscopy. Understanding the nature of specimen charging can help in devising methods to reduce or even avoid its effects and thus improve the rate of data collection as well as the quality of the data. We describe a series of experiments that help to characterize the charging phenomenon, which has been termed the Berriman effect. The pattern of buildup and disappearance of the charge pattern has led to several suggestions for how to alleviate the effect. Experiments are described that demonstrate the feasibility of such charge mitigation.
样品充电可能是导致冷冻电子显微镜图像高度可变且总体质量较低的最重要因素之一。了解样品充电的本质有助于设计方法来减少甚至避免其影响，从而提高数据收集率以及数据质量。我们描述了一系列有助于表征充电现象的实验，该现象被称为贝里曼效应。电荷模式的积累和消失模式引发了一些关于如何减轻该效应的建议。文中描述的实验证明了这种电荷减轻方法的可行性。
