Lv X J, Zhao L N, Lu J, Zhao G, Liu H, Qin Y Q, Zhu S N
National Laboratory of Solid State Microstructure, Nanjing University, Nanjing 210093, People's Republic of China.
Opt Express. 2009 Sep 28;17(20):18241-9. doi: 10.1364/OE.17.018241.
In this article we develop a method to evaluate the poling quality of optical superlattice (OSL) based on two-dimensional (2D) Fourier transform. To demonstrate this method, -Z or +Z face etched OSL samples with desired patterns are fabricated by standard electric field poling technique. By analyzing the processed micrograph of the etched surfaces, the magnitude of the reciprocal vectors of the OSL are calculated directly and rapidly. Second harmonic generation (SHG) experiment is performed to validate the evaluation result.
在本文中，我们开发了一种基于二维（2D）傅里叶变换来评估光学超晶格（OSL）极化质量的方法。为了演示该方法，通过标准电场极化技术制备了具有所需图案的-Z面或+Z面蚀刻OSL样品。通过分析蚀刻表面的处理显微照片，可直接快速计算出OSL倒易矢量的大小。进行二次谐波产生（SHG）实验以验证评估结果。
