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Soft x-ray free electron laser microfocus for exploring matter under extreme conditions.

作者信息

Nelson A J, Toleikis S, Chapman H, Bajt S, Krzywinski J, Chalupsky J, Juha L, Cihelka J, Hajkova V, Vysin L, Burian T, Kozlova M, Fäustlin R R, Nagler B, Vinko S M, Whitcher T, Dzelzainis T, Renner O, Saksl K, Khorsand A R, Heimann P A, Sobierajski R, Klinger D, Jurek M, Pelka J, Iwan B, Andreasson J, Timneanu N, Fajardo M, Wark J S, Riley D, Tschentscher T, Hajdu J, Lee R W

机构信息

LawrenceLivermore National Laboratory, 7000 East Avenue, Livermore, CA 94550, USA.

出版信息

Opt Express. 2009 Sep 28;17(20):18271-8. doi: 10.1364/OE.17.018271.

Abstract

We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 microJ, 5 Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The OAP was mounted and aligned with a picomotor controlled six-axis gimbal. Beam imprints on poly(methyl methacrylate) - PMMA were used to measure focus and the focused beam was used to create isochoric heating of various slab targets. Results show the focal spot has a diameter of < or =1 microm. Observations were correlated with simulations of best focus to provide further relevant information.

摘要

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