Probing layer number and stacking order of few-layer graphene by Raman spectroscopy.
作者信息
Hao Yufeng, Wang Yingying, Wang Lei, Ni Zhenhua, Wang Ziqian, Wang Rui, Koo Chee Keong, Shen Zexiang, Thong John T L
机构信息
Center for Integrated Circuit Failure Analysis and Reliability (CICFAR), Department of Electrical and Computer Engineering, National University of Singapore, Singapore.
出版信息
Small. 2010 Jan;6(2):195-200. doi: 10.1002/smll.200901173.
PMID:19908274
Abstract
摘要
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